Shared Service

Large-scale research equipment and laboratories / Imaging Systems

Electron Microscopy

Strain-field measurements (TEM/STEM)

Usable by:

Strain measurements by means of S/TEM techniques like GPA, NBED, Dark-Field Electron Holography, or 4D-STEM

Further information:

https://bua.openiris.io/Landing/Res...

Possible user: No restrictions

Email: tore.niermann@tu-berlin.de

Provider:

FG Elektronen- und Ionen-Nanooptik

Provider Location:

Ernst-Ruska-Building